17th IMEKO World Congress on Metrology in the 3rd Millennium, Dubrovnik (Croacia). 22-27 junio 2003
Resumen:
No disponible/Not available
Palabras clave: No disponible/Not available
Fecha de publicación: 22-jun-2003
Cita:
M. Carpentieri, J. Silveira, R. Giannetti, "A system for monitoring the spatial and intensity distribution on CCD patterns applied to in situ characterization", presentado en 17th IMEKO World Congress on Metrology in the 3rd Millennium, Dubrovnik, Croacia, 22-27 junio 2003
IIT-03-126C
